Technical Notes - Quick Method for Detecting Preferred Orientation (Metals Tech., June 1948, TN 2)

- Organization:
- The American Institute of Mining, Metallurgical, and Petroleum Engineers
- Pages:
- 2
- File Size:
- 99 KB
- Publication Date:
- Jan 1, 1949
Abstract
In the course of work on grain growth in high purity aluminum a simple optical method was developed for detecting the presence or absence of preferred orientation in annealed specimens. The specimens were prepared by grinding, polishing and "deep etching." The etching reagent used for high purity aluminum has been described.* The resulting etch pits produced selective
Citation
APA:
(1949) Technical Notes - Quick Method for Detecting Preferred Orientation (Metals Tech., June 1948, TN 2)MLA: Technical Notes - Quick Method for Detecting Preferred Orientation (Metals Tech., June 1948, TN 2). The American Institute of Mining, Metallurgical, and Petroleum Engineers, 1949.