Speciation of Uranium in Amorphous Silica Layers

The speciation of Uranium in silica-rich depositional layers in the proximity to uranium ore deposits was investigated using micro X-ray fluorescence (VESPERS beamline), X-ray Photoelectron Spectroscopy, Laser-Ablation ICP-MS, Scanning Electron Microscopy, X-ray diffraction and micro-Raman Spectroscopy. The heterogeneous Si-rich laminations contain micrometer-size inclusions of secondary uranyl-minerals. The U concentration in these layers range from several ppm to lower weight percent and the U 4f spectra indicate variable U6+ : U4+ ratios. Correlation between the concentrations of U and other metals (M) suggests the presence of M-U-bearing nanoparticles or species within the amorphous silica matrix.