Scanning Electron Microscope Gives Researchers A Closer Look At Rock Fractures

- Organization:
- The American Institute of Mining, Metallurgical, and Petroleum Engineers
- Pages:
- 3
- File Size:
- 418 KB
- Publication Date:
- Jan 6, 1969
Abstract
The scanning electron microscope (SEM), became commercially available in 1966. Embodying some unique features not provided by conventional electron microscopes, this new electron-optical instrument offers the scientific community a new way of observing the surfaces of materials. In rock mechanics research, the SEM should prove a useful basic tool in characterizing rock fracture on a very small scale and thus contribute to a better understanding of rock behavior at larger scales. This article presents one example of how the SEM is being applied to such research at the Twin Cities Mining Research Center operated by the U.S. Bureau of Mines in Minneapolis. This research center conducts theoretical and experimental studies on a broad range of mechanisms that induce disintegration by the application of energy to rock.1 Some of these studies are concerned with the relation of microstructure to rock behavior and are carried out mainly with the petrographic microscope. At the same time, however, the center recognizes that this relation must be studied through several orders of magnitude, from lattice-size units of rock-forming minerals to field-size rock units. The SEM fits this scheme by extending the capability of the petrographic microscope into smaller orders of magnitude. However, because its resolution is limited to about 200 A at 10,000x, the SEM is not capable of resolving lattice-size units, and hence a conventional electron microscope with a much greater resolution capability is necessary at this order of magnitude.
Citation
APA:
(1969) Scanning Electron Microscope Gives Researchers A Closer Look At Rock FracturesMLA: Scanning Electron Microscope Gives Researchers A Closer Look At Rock Fractures. The American Institute of Mining, Metallurgical, and Petroleum Engineers, 1969.