RI 6681 Measurement Of Backscattered Electrons In An Electron Probe Microanalyzer

The National Institute for Occupational Safety and Health (NIOSH)
Philip G. Burkhalter
Organization:
The National Institute for Occupational Safety and Health (NIOSH)
Pages:
25
File Size:
2428 KB
Publication Date:
Jan 1, 1965

Abstract

Total yield and backscattered electron coefficients were measured in this Bureau of Mines study in an microanalyzer as a function of atomic number and of primary crier: ;y in the 15- to 35-kilovolt range. The electron coefficients were obtained indirectly from measurements of the specimen electron current and the primary beam current collected in a Faraday cage and were measured with a precision better than 0.5 percent. Secondary electron emission was suppressed with opposing potential applied to a screen grid surrounding the specimen. The values of the backscattered electron coefficients agreed with published values within 5 percent.
Citation

APA: Philip G. Burkhalter  (1965)  RI 6681 Measurement Of Backscattered Electrons In An Electron Probe Microanalyzer

MLA: Philip G. Burkhalter RI 6681 Measurement Of Backscattered Electrons In An Electron Probe Microanalyzer. The National Institute for Occupational Safety and Health (NIOSH), 1965.

Export
Purchase this Article for $25.00

Create a Guest account to purchase this file
- or -
Log in to your existing Guest account