RI 5538 Fluorescent X-Ray Spectrographic Analysis: Studies Of Low-Energy K, L, And M Spectral Lines ? Summary

The National Institute for Occupational Safety and Health (NIOSH)
William J. Campbell
Organization:
The National Institute for Occupational Safety and Health (NIOSH)
Pages:
25
File Size:
1152 KB
Publication Date:
Jan 1, 1959

Abstract

These investigations were undertaken as part of a program to determine the optimum X-ray spectral lines to use for analyzing the wide variety of samples received by the X-ray Laboratory. Theoretical calculations and experimental data derived from these investigations show that longer wavelength spectral lines, > 2A, are very useful for many analytical problems. Because of the low fluorescence yield of the elements of atomic numbers 13-22 and the small depth of penetration of their X-ray spectral lines, these elements were originally considered to be insensitive; however, these studies show that the wide dispersion of their spectral lines, coupled with their weak beta lines, permits the use of wide collimation, thus increasing the line intensity. More importantly, the background due to scattered primary radiation is very low in the long-wavelength region.
Citation

APA: William J. Campbell  (1959)  RI 5538 Fluorescent X-Ray Spectrographic Analysis: Studies Of Low-Energy K, L, And M Spectral Lines ? Summary

MLA: William J. Campbell RI 5538 Fluorescent X-Ray Spectrographic Analysis: Studies Of Low-Energy K, L, And M Spectral Lines ? Summary. The National Institute for Occupational Safety and Health (NIOSH), 1959.

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