RI 5526 X-Ray Emission Spectrographic Analysis Of High-Purity Rare-Earth Oxides ? Summary And Introduction

Instrumental analysis has become an indispensable tool in research and production of the rare-earth elements. This development can be attributed mainly to a combination of two factors--the marked chemical similarity of the rare-earth elements, which excludes classical methods of analysis, and the speed and accuracy of instrumental-analysis techniques. With continued improvements in methods of producing high-purity rare-earth elements, keeping pace instrumentally is becoming much more difficult. Accordingly, greater emphasis is being placed on improving instrumental limits of detection and accuracy. The methods employed most frequently for determining impurities in rare-earth elements involve use of the optical-emission spectrograph (3, 4)4/ and the spectrophotometer (9). Although numerous X-ray-emission spectrographic methods (6-8) have been developed for analyzing rare earths, these techniques have not included detection of low-level impurities. This investigation was conducted to find the precision and accuracy of X-ray fluorescence in deter-mining impurities in rare-earth oxides in the 0.01-to 1.0-percent-concentration range.