Quantitative Mineral Analysis of Ores and Minerals Processing Products using X-ray Diffraction

Characterising the weight percentage of each mineral in base metal ores is an integral part of assessing the quality of an ore in terms of its processing properties. The Rietveld method, which uses X-ray diffraction data, has been applied to routinely quantify the minerals in lead/zinc and copper ores from Mount Isa Mines Limited and supergene copper ores from Ernest Henry Mining as well as their related products from the concentrators. The Rietveld method has been tested by comparing Rietveld mineral data with a standard sample with known mineral weight percentages and comparing Rietveld mineral data with mineral data calculated from elemental assays where the element only exists in one mineral such as lead in galena. Where this latter situation does not occur, the Rietveld method has been checked with both elemental and optical microscope data. In all cases, there is a good correspondence between the Rietveld data and the data it was checked against with absolute differences generally in the range of 0.5 to 3 wt per cent. The Rietveld method generally quantifies all minerals occurring over 1 wt per cent in one analysis and is less expensive and more routine compared to traditional methods such as optical microscope point counting. The Rietveld method can be applied to many stages of the mining cycle such as exploration, feasibility studies, mining, minerals processing and for environmental studies.