Molecule Polarization State For Refractive Indices Material Compensation Film Thickness

The Minerals, Metals and Materials Society
Chia-Fu Chang
Organization:
The Minerals, Metals and Materials Society
Pages:
17
File Size:
536 KB
Publication Date:
Jan 1, 2006

Abstract

We revise the applicability of the theory of self-organized criticality (SOC) to the process of magnetic relaxation in type-II superconductors. It is demonstrated that the driving parameter of self-organization of vortices is the energy barrier for flux creep and not the current density. Power spectrum of the magnetic noise due to vortex avalanches is calculated and is predicted to vary with time during relaxation.
Citation

APA: Chia-Fu Chang  (2006)  Molecule Polarization State For Refractive Indices Material Compensation Film Thickness

MLA: Chia-Fu Chang Molecule Polarization State For Refractive Indices Material Compensation Film Thickness. The Minerals, Metals and Materials Society, 2006.

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