Institute of Metals Division - X-Ray Line Broadening from Explosively Loaded Copper (TN)

In an investigation of the microstructure of shock-loaded metal specimens1 C. S. Smith found that there was little distortion of grain boundaries or change in external dimensions, although the hardness corresponded to that produced by severe rolling. Furthermore, the hardness of individual grains was independent of the deformation structures present; grains with no markings were as hard as those heavily populated with markings. These markings which resemble twins do not appear in copper until high shock-loads of the order of 200 kb are applied. It appears that due to the high velocity of a shock wave and its sharp front, heavy deformation takes place on a submicroscopic scale. In this work an attempt was made to examine this deformation, particularly at a load below which macroecopic markings appear. The broadening of 200 and 400 diffraction peaks was examined from the face of a poly crystalline sample normal to the direction of the shock wave. These peaks were chosen because the elastic constants in copper are such that residual strains would be greatest in the <100> directions; hence, the strain-broadening contribution to these peaks would be large in comparison to other sets. Also the broadening due to stacking faults and microtwins would be greatest with this set.2 A complete Fourier analysis of these peaks was made, as described by warren,&apos; using the Stokes correction with peaks from an annealed sample.3 With the aid of the U. S. Army Ordnance Corps EDVAC computer and a curve matching program, sixty sine and sixty cosine coefficients were obtained for each peak. The last of these was about 1.5 pct or less of the largest coefficient, indicating good representation. Transverse sections from a 1.5 in. rod of as-drawn electrolytic tough-pitch copper were reduced in cross-sectional area about 50 pct by cross rolling. Disks 1.5 in. in diam were recrystallized at 275 °C for 30 min and then at 300°C for the same time. The faces were polished and deeply etched in nitric acid to remove 25 mils. The grain size was 0.02 mm. Laue back-reflection patterns indicated the sample was well recrystallized. The two diffraction peaks from this sample were recorded on a Norelco diffractometer using filtered copper radiation. Peak intensities were kept less than 600 cps to assure linearity of the counter and circuitry. This sample was then placed between two rods of the same material and diameter. The top rod was 2.25 in. long and the bottom rod 1 in. long. (In