Institute of Metals Division - A Technique for Orienting Grains in a Fine-Grained Polycrystalline Hexagonal Close-Packed Metal Using the Polarized-Light Microscope (TN)

The American Institute of Mining, Metallurgical, and Petroleum Engineers
R. E. Reed-Hill D. H. Baldwin
Organization:
The American Institute of Mining, Metallurgical, and Petroleum Engineers
Pages:
3
File Size:
274 KB
Publication Date:
Jan 1, 1965

Abstract

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WITH the polarized-light microscope, the basal-plane trace may be located on hcp crystal surfaces to an accuracy of approximately 1 deg. This determination can also be made on very small crystalline areas, approaching a micron in width. Measured basal-plane trace distributions on selected specimen surfaces can yield1,2 valuable texture information. However, the polarized-light microscope is probably best suited to orienting
Citation

APA: R. E. Reed-Hill D. H. Baldwin  (1965)  Institute of Metals Division - A Technique for Orienting Grains in a Fine-Grained Polycrystalline Hexagonal Close-Packed Metal Using the Polarized-Light Microscope (TN)

MLA: R. E. Reed-Hill D. H. Baldwin Institute of Metals Division - A Technique for Orienting Grains in a Fine-Grained Polycrystalline Hexagonal Close-Packed Metal Using the Polarized-Light Microscope (TN). The American Institute of Mining, Metallurgical, and Petroleum Engineers, 1965.

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