Institute of Metals Division - A Modified X-Ray Diffraction Microscope Technique for Study of Dislocations in Crystals

This paper describes a modified X-ray diffraction microscope wzethod based on the general principles of Berg-Bawett's Method, Lang's Method, and Woosters1 Technique. This new method may be used for stationary or oscillatory photomacrographs, with both reflection and transmission techniques. In the stationary technique, a small point-source of a divergent X-ray beam of white radiation is used; in the oscillatory technique, a monochromatic divergent beam is employed. The chief advantages of the method described herein are that only approximate alignment of the Bragg angle -of-interest is needed during exposure, and that a large portion of a crystal-specimen surface can he irradiated. In recent years, the study of dislocations through X-ray diffraction microscope techniques has received considerable attention as concerns the per,fection of single crystals. Very promising results have appeared in the literature.'-' These techniques are very useful when the dislocation density of a crystal is near 105 per sq cm or lower. The principle of X-ray diffraction microscopy is based on the differential effect of X-ray primary extinction between the distorted parts and the perfect parts of a crystal. When an X-ray beam impinges on a set of planes of a crystal at the correct Bragg angle, diffraction of X-rays will occur with a 90-deg phase shift of the diffracted beam. This once-diffracted beam still forms the correct Bragg angle with the planes ahead of it, if the planes are not distorted. Thus, part of the strength of the once-diffracted beam is rediffracted and the beam continues to travel in the direction of the primary X-ray beam. This twice-diffracted beam not only takes away part of the strength of the once-diffracted beam, but also causes destructive interference with the primary beam because it now is exactly 180 deg out of phase with the primary beam. As the primary beam goes farther and farther into the crystal, its intensity is continuously weakened. Asa result, the ultimate X-ray diffraction power of a set of undistorted planes is largely extinguished. This phenomenon is called primary extinction.1,2'4 If the set of planes ahead of it is distorted, the once-diffracted beam will have less chance to be rediffracted, because it could not meet the exactly correct Bragg angle for rediffraction. If a part of the beam does rediffract, this twice-diffracted beam is not exactly 180 deg out of phase with the primary beam, and thus it causes less destructive interference. As a result, the registered X-ray diffraction power of the distorted part of a crystal appears stronger than that of the perfect part. Thus, point-by-point contrast of a diffraction image is theoretically possible from a crystal containing dislocations. Two most popular X-ray diffraction microscope techniques today are Berg-Barrett's Method and Lang's Method. Both of these techniques require a