Electrical, Optical and Structural Properties of Vacuum Evaporated CdTe Thin Films

Polycrystalline CdTe thin films were prepared by vacuum evaporation on glass substrates. The I-V plots which were linear were used to find the resistivity. A value of 2.10×106 .cm was obtained. The transmittance was measured in the wavelength range 400-1100 nm. The bandgap energy was found to be 1.48 eV. X-ray diffraction pattern shows that the material deposits in the zinc blend structure with one strong reflection from the C(111) plane. The scanning electron microscope image shows a uniform surface with a small density of large (mµ1£) grains scattered on the surface.