Detection of Collectors on Mineral Grains by Tof-Sims

"TOF-SIMS (Time-of-flight secondary ion mass spectrometry) was used to detect collectors sorbed onto the surface of mineral particles in concentrate and tailings samples from the Brunswick, Matagami and Kidd Creek concentrators. This technique uses ion beams from either Cs or Ga sources to sputter the particle surface, a method which reduces fractionation of the collector molecule during sampling.In the Brunswick Zn circuit, sphalerite particles lost to the scavenger tails had less amyl xanthate and isobutyl xanthate compared to sphalerite recovered to the Zn final concentrate. Xanthates were detected on the surface of sphalerite particles floating to the CuPb final concentrate.At Matagami, significantly more isopropyl xanthate and isobutyl dithiophosphate were detected on sphalerite recovered to the Zn final concentrate, compared to sphalerite lost in the Zn rougher tails.In the Zn circuit of Kidd Creek, sphalerite lost to the tails had on average ten times less xanthate compared to sphalerite recovered into the Zn final concentrate. Xanthate was also detected on the floated pyrite particles. In addition to isobutyl xanthate, amyl xanthate was also detected on the floated sphalerite and pyrite particles.This preliminary investigation has (a) demonstrated the ability of TOF-SIMS to detect individual collectors on particle surfaces from plant samples and (b) shown that TOF- SIMS is an excellent tool, complimentary to TOF-LIMS, in establishing the surface chemistry of minerals as related to mineral processing."