Detection of collectors on concentrator mineral grains by time-of-flight secondary-ion mass spectrometry (TOF-SIMS)

TOF-SIMS was used to detect, identify from parent molecular ions and determine the relative concentrations of collectors sorbed on the surface of mineral particles in concentrate and tailings samples from three Canadian concentrators. In the Kidd Creek Zn circuit, sphalerite lost to tailings carried on average a quarter of the amount of isobutyl xanthate present on that recovered to Zn concentrate; amyl xanthate, which is not reported as added to the circuit, was also detected on floated sphalerite and pyrite. At Brunswick, sphalerite particles lost to the scavenger tailings had ten times less amyl xanthate and isobutyl xanthate than those recovered to the Zn final concentrate, while both xanthates were detected on sphalerite floated to the Cu-Pb cleaner circuit. At Matagami, significantly more isopropyl xanthate and isopropyl dithiophosphate were detected on sphalerite recovered to the final Zn concentrate than on that lost to the Zn rougher tailings