Collector Screening by TOF-MS for Platinum & Palladium Flotation

International Mineral Processing Congress
Stephen Chryssoulis Stamen Dimov Frank Cappuccitti
Organization:
International Mineral Processing Congress
Pages:
1
File Size:
123 KB
Publication Date:
Jan 1, 2003

Abstract

Surface organic microanalysis of platinum (Pt) and palladium (Pd) minerals by TOF MS1 is an attractive complement and potential alternative to conventional collector screening methods. Its attractiveness lies on its ability to focus on individual Pt and Pd mineral particulates, therefore providing a more targeted approach. The only requirement is knowledge of the occurrence (mineral composition, grain size and association) of Pt/Pd in the feed sample. This newly developed technique can detect, and identify collectors and quantitate loadings on individual Pt/Pd mineral particulates at plant concentration levels. Using this technology, collector loadings were measured on Pt and Pd metal plates and on PtS2 and PdS particulates which had been exposed together to aqueous solutions of different collectors. Thus, data were obtained on collector selectivity, the effect of sulphur; and of depressants, the latter in combination with TOF-LIMS2 results. Staged rougher tests on North American and UG-2 ores linked Pt/Pd flotation kinetics with collector loadings and ultimately grade/recovery.
Citation

APA: Stephen Chryssoulis Stamen Dimov Frank Cappuccitti  (2003)  Collector Screening by TOF-MS for Platinum & Palladium Flotation

MLA: Stephen Chryssoulis Stamen Dimov Frank Cappuccitti Collector Screening by TOF-MS for Platinum & Palladium Flotation. International Mineral Processing Congress, 2003.

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