Characterization of The SnO2:F/CdS:In Structures

SnO2:F/CdS:In bilayers were produced by the spray pyrolysis technique on glass substrates. The structures were characterized by recording and investigating their transmittance curves, I-V plots, X-ray difractograms (XRD) and by observing their scanning electron microscope (SEM) images. From the I-V plots it was found that the SnO2:F forms an ohmic or quasi-ohmic contact with CdS:In. XRD patterns show the polycrystalline nature of the films and show that there is a small shift in the position of the (200) line of SnO2:F without the appearance of new peaks. The morphology of the structures are compared with those of SnO2:F alone and CdS:In alone on glass substrates.