Characterization of Rare Earth Minerals with Field Emission Scanning Electron Microscopy

- Organization:
- Canadian Institute of Mining, Metallurgy and Petroleum
- Pages:
- 9
- File Size:
- 1564 KB
- Publication Date:
- Jan 1, 2012
Abstract
"Rare earth elements are becoming increasingly in demand, due to their prevalence in both renewable energy devices and high-end electronics. The characterization of the composition, morphology and volume fraction of the various phases that have valuable rare earths in the ores are needed to find the optimal industrial process to extract the ores containing the rare earths. Rare earth-bearing minerals contain many elements with the M-and L-lines overlap, requiring a high degree of resolution, pushing the boundaries of scanning electron microscopy quantitative analysis. Enhanced microscopy at a high spatial resolution with improved x-ray quantitative analysis enables the accurate determination of the distribution of the desired rare earths in various mineral phases. INTRODUCTIONRare earth elements are becoming increasingly in demand, due to their prevalence in both renewable energy devices and high-end electronics. From batteries (lanthanum and cerium), to magnets (dysprosium and neodymium) and lighting (yttrium), the rare earth elements are crucial to the advancement of technology, and to energy saving devices (Crow, 2011). The goal of this project is to characterize the composition, morphology and volume fraction of the various phases that have valuable rare earths in the ores in order to estimate the economical VALUES (of the ores and to find the optimal industrial process to extract the ores containing the rare earths. High spatial resolution imaging and x-ray microanalysis are needed to reach this goal. In this work, the results obtained with a cold-field-emission scanning electron microscope (FE-SEM) and a silicon drift detector (SDD) energy dispersive spectrometry (EDS) detector at low accelerating voltage are compared to experimental conditions typically used with electron probe microanalysis (EPMA) instrument.With this improvement, a detailed scientific analysis of the composition of these, and other, ores will become possible with a SEM/EDS system. This will help to better understand how such ores were formed, hence assisting in finding them, and to better understand how to process them in preparation for high end industrial applications, namely through mineral processing."
Citation
APA:
(2012) Characterization of Rare Earth Minerals with Field Emission Scanning Electron MicroscopyMLA: Characterization of Rare Earth Minerals with Field Emission Scanning Electron Microscopy. Canadian Institute of Mining, Metallurgy and Petroleum, 2012.