Characterization of Rare Earth Minerals Using X-Ray Phase Map with High Spatial Resolution Field-Emission Scanning Electron Microscope

Rare earth elements (REEs) become increasingly significant for renewable energy devices and high-technology electronic products because of their large-scale popularity and applications. In this project, a field-emission scanning electron microscope was used to characterize the composition and distribution of REEs-bearing minerals. X-ray elemental maps were acquired with a large area x-ray detector (60 and 80 mm2 collecting area) and annular detector (60 mm2 collecting area), which allow fast x-ray acquisition at high count rate. These elemental maps were transformed into phase maps, which are used to identify the composition of the mineral phases and the REEs distribution over a large area. The phase maps are an easy way to distinguish the phases with and without REEs and compare the efficiency of different REEs extraction processes. Different methods (manual and automatic) for producing phase map were studied by comparing the distribution of REEs obtained from the same area.