Applications of Scanning Electron Microscope to Clay and Other Fine-Grained Minerals

The Minerals, Metals and Materials Society
W. D. Keller
Organization:
The Minerals, Metals and Materials Society
Pages:
17
File Size:
1391 KB
Publication Date:
Jan 1, 1982

Abstract

Scanning electron microscopy (SEM) accompanied by X-ray energy dispersive analysis (XES) is a useful tool in process clay mineralogy. The texture of kaolin, illustrated by SEM, gives a clue to its mode of genesis and probable industrial application. One type of kaolin, originating dominantly by weathering, has an open texture, slakes readily, and is used for filling and coating paper. Another type, in contrast, originates by diagenesis of Al-silicate sediments, and spectacularly resists slaking, thereby enabling it to maintain its bulk density and controlled size and shape of particles after crushing and moistening; this meets an important requirement for the manufacture of refractories. Ratios of elemental Al:Si that may be rapidly determined by SEM and XES yield information on the origin and purity of bauxite and bauxitic clays, and aid in quality control and processing of them. SEM of dissimilar textures of quartz, as in chert and novaculite, are evidence for geothermometry on a stratigraphic scale that is potentially useful in delimiting thermally favorable or unfavorable areas for hydrocarbon exploration, and possibly for unexposed metallic ore deposits.
Citation

APA: W. D. Keller  (1982)  Applications of Scanning Electron Microscope to Clay and Other Fine-Grained Minerals

MLA: W. D. Keller Applications of Scanning Electron Microscope to Clay and Other Fine-Grained Minerals. The Minerals, Metals and Materials Society, 1982.

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