Analysis Of Interfacial Water By In-Situ FTIR/Internal Reflection Spectroscopy

The in-situ FTIR/IRS technique has been used to spectroscopically characterize interfacial water near a hydrophilic surface. Interfacial water was examined spectroscopically over known distances from the surface of a silicon single crystal by appropriate design of the geometry and optics of the internal reflection system. The in-situ FTIR/IRS spectra of interfacial water were examined by consideration of the 0 -H stretching region (3000 -3800 cm-1) associated with the vibrational spectra of water. The broad peak: in this region which describes the interfacial water structure was deconvoluted in order to isolate the overlapping spectral features of the interfacial water. Preliminary spectral results indicate the prevalence of an ice-like water structure (-3200 cm-!) at the silicon surface. Importantly, it appears that the interfacial water structure may extend a considerable distance (several tens of molecular layers) from the surface as established from the spectroscopic depth profile measurements which show that the free OH stretch at 3600 cm-1 becomes very significant at distances from the surface exceeding 400 nm.